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MEASUREMENT OF THICKNESSES OF OPTICALLY TRANSPARENT LAYERED STRUCTURES BY THE SPECTRAL INTERFEROMETRY METHOD

heading: 
APPLIED RADIOPHYSICS

Manuscript submitted 14.12.2016
PACS 42.87.Bg; 68.55.Jd
Radiofiz. elektron. 2017, 22(1): 77-85
Full text (PDF)

References: 
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  3. LUKIN, K. A., 2005. Noise Radar Technology: the principles and short overview. Applied Radio Electronics. vol. 4, no. 1, pp. 4–13.
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