Skip to main content
RADIO PHYSICS AND ELECTRONICS
RADIOFIZIKA I ELEKTRONIKA
ISSN 2415-3400 (Online)
ISSN 1028-821X (Print)
RADIOFIZ. ELEKTRON.
DOI:
https://doi.org/10.15407/rej
Main
About
Editorial Board
Contact
Editor in Chief
Deputy Editors-in-Chief
Executive Secretary
Editorial Board Members
International Advisory Board
Policies
Focus and Scope
Publication Frequency
Publication Ethics and Malpractice Statement
Anti-plagiarism Policy
Open Access Policy
Peer Review Process
Indexed/Abstracted
Submissions
Author Guidelines
Copyright Notice
Privacy Statement
Archive
2021
№ 1
№ 2
№ 3
№ 4
2020
№ 1
№ 2
№ 3
№ 4
2019
№ 1
№ 2
№ 3
№ 4
2018
№ 1
№ 2
№ 3
№ 4
2017
№ 1
№ 2
№ 3
№ 4
2016
№ 1
№ 2
№ 3
№ 4
2015
№ 1
№ 2
№ 3
№ 4
Subscription
Contacts
Current issue
Search
You are here
Home
»
APPLIED RADIOPHYSICS
APPLIED RADIOPHYSICS
ELECTROMECHANICAL RESONATOR UNDER THE INFLUENCE OF TELEGRAPH UNBALANCED NOISE OF FREQUENCY
Maizelis ZА
.
ELECTROMECHANICAL RESONATOR UNDER THE INFLUENCE OF TELEGRAPH UNBALANCED NOISE OF FREQUENCY
. 2016 ;7(21):71-76.
Read more
about ELECTROMECHANICAL RESONATOR UNDER THE INFLUENCE OF TELEGRAPH UNBALANCED NOISE OF FREQUENCY
MEASUREMENT OF THICKNESSES OF OPTICALLY TRANSPARENT LAYERED STRUCTURES BY THE SPECTRAL INTERFEROMETRY METHOD
Lukin KA
,
Tatyanko DN
,
Pikh AB
,
Zemlyaniy OV
.
MEASUREMENT OF THICKNESSES OF OPTICALLY TRANSPARENT LAYERED STRUCTURES BY THE SPECTRAL INTERFEROMETRY METHOD
. 2017 ;22(1):77-85.
Read more
about MEASUREMENT OF THICKNESSES OF OPTICALLY TRANSPARENT LAYERED STRUCTURES BY THE SPECTRAL INTERFEROMETRY METHOD
Pages
« first
‹ previous
1
2
3
4
5