ISSN 1028-821X (Online)

ISSN 2415-3400 (Print)

Current issue

Radiofiz. elektron. 2018, 23(2)

DOI: https://doi.org/10.15407/rej2018.02

MICROWAVE ELECTRODYNAMIC

Chernyshov N. N., Belousov A. V., Alkhawaldeh M. A. F., Pisarenko V. M., Rogozin I. V.
Photovoltaic effect at spin resonance in quantum magnetic field

Language: English

Radiofiz. elektron. 2018, 23(2): 4-8

Abstract | Full text (PDF)

RADIOWAVE PROPAGATION, RADIOLOCATION AND REMOTE SENSING

Ovsyanikov V. V., Beznosova E. R.
Broadband antennas and antenna arrays with reactive loads
Language: Russian

Radiofiz. elektron. 2018, 23(2): 9-22

Abstract | Full text (PDF)

Nickolaenko A. P., Galuk Yu. P., Hayakawa M.
Deviations of source bearing in the earth–ionosphere cavity with the day–night non-uniformity
Language: Russian
Radiofiz. elektron. 2018, 23(2): 22-38
Abstract | Full text (PDF)

Sytnik O. V., Pochanin G. P., Masalov S. A., Ruban V. P., Kholod P. V.
Method for measurement of mobile objects coordinates by video-pulse radar
Language: Russian
Radiofiz. elektron. 2018, 23(2): 39-48
Abstract | Full text (PDF)

Mytsenko I. M., Khalameyda D. D.
System of automatic frequency control of heterodyne of radar receiver with magnetron transmitter
Language: Russian
Radiofiz. elektron. 2018, 23(2): 48-53
Abstract | Full text (PDF)

SOLID-STATE AND PLASMA RADIOPHYSICS

Beletskii N. N., Borysenko S. A.
Tunneling of electromagnetic waves through the three-layered structure containing a negative-permittivity layer

Language: Russian

Radiofiz. elektron. 2018, 23(2): 54-60
Abstract | Full text (PDF)

VACUUM AND SOLID STATE ELECTRONICS

Machekhin Yu. P., Kurskoy Yu. S., Gnatenko A. S., Tkachenko V. A.
Superradiance of nano lasers in information-measuring procedures

Language: Russian
Radiofiz. elektron. 2018, 23(1): 61-68
Abstract | Full text (PDF)

MICROWAVE AND TERAHERTZ TECHNOLOGY

Dzyubenko M. I., Kamenev Y. E., Radionov V. P., Litvina Z. Y.
Resonator method for determination of losses in one-dimensional metal gratings in terahertz range

Language: Russian

Radiofiz. elektron. 2018, 23(2): 69-75

Abstract | Full text (PDF)